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Electrical & Test Equipment
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AGILENT 71612C 12.5 Gb/S Error Perfomran 70843 70340A
12.5 Gb/S Error Perfomrance Analyzer OPTIONS UHF & 100
| Start Price |
USD 47,000.00 |
| Current Price |
USD 47,000.00 |
| Time Left |
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| Bid Count |
0 |
| Buy It Now Price |
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| Reserve Price |
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| Start Time |
Monday, November 17, 2008 |
| End Time |
Monday, November 24, 2008 |
| Location |
TEXAS |
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See more about 'AGILENT 71612C 12.5 Gb/S Error Perfomran 70843 70340A '
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Description
AGILENT / HP 71612C 12.5 GB/S Error Performance Analyzer BUY IT NOW PRICE INCLUDES: ¨ CERTIFICATE OF CALIBRATION ¨ 10 DAY RIGHT OF RETURN ¨ 3 MONTH WARRANTY ¨ ALL STANDARD ACCESSORIES SYSTEM INCLUDES: 70843C WITH AGILENT CALIBRATION CERT 70340A WITH MEASUREMENT ASSURANCE TECHNOLOGY CALIBRAITON CERT 70004A QTY 2 MSIB CABLES QTY 2 POWER CORDS QTY 5 3.5MM F-F SMA CONNECTORS QTY 2 3.5MM F-M SMA CONNECTORS OPTIONS: UHF- ERROR DETECTOR PATTERN GENERATOR 100- INTERNAL CLOCK SOURCE ( 70340A ) AGILENT CALIBRATION ON 70843C MAT CALIBRATION ON 70340A DESCRIPTION : The Agilent 71612C error performance analyzer is the ideal solution for the research, development and manufacturing test of Gbit lightwave and digital components, devices and subsystems from 100 Mb/s to 12.5 Gb/s. With this high performance serial pattern generator and error detector, you can perform error analysis to verify the operation and quality of lightwave submarine cable systems, SONET/SDH telecom and datacom transceivers, Gbit datacom serial links, high-speed logic devices, and optical amplifiers and modulators. The analyzer can be used to test 10.6 Gbit ethernet and forward error correction (FEC) rates giving you a breadth of applications to help you thoroughly test and characterize your devices for complete confidence in your product. The four sub-rate outputs of the 71612C are suitable for the generation of 3.125 Gb/s test patterns required to test the XAUI interface of 10 Gigabit Ethernet devices. What's more, the 'alternate pattern mode' of operation allows synchronous selection of the de-skew and data patterns. Features: Generate exceptional waveforms even with reflective or poor terminations Dedicate the analyzer's whole display for pattern editing Simulate long distance testing using burst-mode gating in re-circulating loop tests Quickly locate the optimum decision point in the eye waveform with auto-decision thresholds and phase alignment Identify individual errored bits in custom patterns using error location analysis (ELA) Display any bit in a custom pattern using the flexible pattern trigger Automatically predict conventionally unmeasurable low BER using Q-factor measurement and eye-contour analysis Generate real-life test patterns to stress your system-under-test Create a cost effective 12.5 Gb/s frequency agile jitter measuring system Convert electrical-to-optical and optical-to-electrical signals that are SONET/SDH compliant “YOUR TOTAL TEST AND MEASUREMENT SOLUTION PROVIDER!” Please Contact Andy Martin at Measurement Assurance for Payment Method or Questions at (877)871-TEST or e-mail Andy@MATtestUSA.com. Powered by eBay Turbo Lister The free listing tool. List your items fast and easy and manage your active items.
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